High reliability with embedded CPU module and reduced number of PCBs
User friendly creation and editing of test programmes
Interface with all standard makes of handlers/wafer probers
Compact foot print
Capability for die attach quality test
Full card cage with expansion slots
Common mother board for digital and analog cards
Host computer is tester independent, free for other usage
Open architecture for future upgradation/new technology
Highest value of ownership
Applications
Semiconductor Production – hi-speed final device testing
Silicon Wafer die/chip testing with wafer prober
Quality Control/Assurance
Incoming Inspection/IQC
Research Labs and Test Centre/Test House
Full Functional Electrical Characteristics Tester for a comprehensive range of Discrete Semiconductor Devices
Standard Model T-201 Capability
Switching Diodes
Zener Diodes
Schottkys
Medium Power Transistors
Power Transistors
Rectifiers
Optional Testing Capability (on request)
Bridge Rectifiers
FETs
MOSFETs
SCR, Triac
Voltage Regulators
High Voltage to 2.5 KV
High Current to 100 A
For fuller details on Tester configurations and testing capabilities for the range of Discrete Semiconductor Devices please refer to the section onApplications
Basic Specifications of Standard Model T-201
1 Voltage / Current
1000V / 20A
2 Polarity
NPN and PNP
3 Test Stations
Multiplex two (2)
4 Test Station Interface
Programmable
5 Mathematical Operations
Divide, Delta, Def
6 Testing
Test by branch
7 Programmable Testing
Branch on pass (BOP), Branch Options on fail (BOF), Auto Ranging, AND/OR Sort
8 Communication
Serial Port
9 I/O
PC104 add-on card
10 Relay Time
5ms typical, with exceptions for high voltage and high current testing
11 Tests and Sequence
Max. 80 per sort
12 Sorting Bins
14 nos. max (parallel)
Power Supplies of standard model t-201
• Linear Supply
+15V 1A, -15V 1A, +40V 1A, -40 V 1A
• SMPS
+5V 20A (2 nos), +12V 4A
• HV Supply
1000V 50mA, -1000V 50mA
tester Options
Delta Vbe Testing
X-Supply Option (VCEX and ICEX Testing)
Testing of AC Parameters
SCR/Triac Testing
Bridge Rectifier Testing
FET Testing
MOSFET Testing
Voltage Regulator Testing
Hardware Options
High Voltage upto 2,500 V Testing
High Current upto 100 A Testing
Head Box for interface with any standard handler/prober
Manual Test Station
High Voltage Manual Test Station
Test Sockets for Manual Test Station as per customer specified package outlines
Checker Box with calibration standard traceability
(one recommended per location)
Multiplexing for upto four (4) Manual Test Station and/or Handler/Prober
Software Options
Saving test data in MS Excel format
Data collection for statistical process control (SPC)
Wafer Mapping
Host Computer (user provided)
Personal Computer Pentium or higher, Monitor & Printer
Operating Requirements
110/220V AC ± 10%, 50/60 Hz, 500VA
Operating Environment
• Temperature
25ºC ± 5ºC
• Humidity
20% to 60% RH
Physical
Tester
550 mm(W) x 850 mm(H) x 600 mm(D)
Head Box
210 mm(W) x 260 mm(H) x 415 mm(D)
Checker Box
100 mm(W) x 265 mm(H) x 360 mm(D)
Manual Test Station
210 mm(W) x 260 mm(H) x 530 mm(D)
Weight
~ 98 kgs. (Standard Test System with a Manual Test Station and Accuracy Checker Box)
User Friendly Test Programming
The OnTest Model T-201 Tester interfaces to a standard PC (customer provided) for creation of test programmes using the menu based templates. Once the programs are created and/or edited on the PC, they are loaded to the tester’s embedded CPU PC104 motherboard, through a RS232C port. Thereafter the PC is free to be put to any other usage and all testing functions are controlled by the tester’s CPU and associated tester hardware. This also provides test programme security.
Creation of test programmes is simple and user friendly, with prompts provided for all the required test parameters, thus ensuring correctness and completeness of each test programme. Creation or editing the test programmes does not require any programming language expertise. Two basic programming modes are provided – Editor and Datalog. The Editor mode is used to create, edit and save the individual test programmes. In the datalog mode, user can join different test programmes, test the complete device as per test programme and datalog the results.
OnTest Model T-201 Test System runs under CPU control thus providing faster testing and is well suited for high speed production requirements – either Go/No-Go or with data logging. The system is designed to perform standard DC and 1 KHz AC parametric measurements. Hardware options provide capability to perform special tests for FETS, MOSFETs, SCR/Triac and Voltage Regulators. The OnTest Model T-201 is a compact small foot print, sophisticated automatic discrete semiconductor tester. Modular in design, configurable to user’s application and requirement, providing highest value of ownership and a full range of testing capabilities with its state-of-the-art hardware and software, ideal for high throughput production testing.
When configured with manual test station, the Model T-201 is a cost effective solution for quality control, characterization, R & D and similar applications. Provides accurate categorization of semiconductor devices as well as datalog measurements.
Test System Configuration
Test System, comprising of Control Unit and Power Supply
Manual Test Station(s)** and/or Handler/Prober (user provided)
Head Box ** for interfacing with any standard device handler or wafer prober
Accuracy Checker Box (recommended - one per location)
Host PC (to be provided by user)
** Standard Tester Model T-201 has provision for connecting upto two (2) Manual Test Stations and/or
combination of Head Box for interface with Handler/Prober.
Minimum one Head Box for interface to use with handler/prober (handler/prober as would be provided by customer) or a Manual Test Station is required to configure a functional test system – please refer to block diagram below
Optional Configurations
Upto four (4) manual test stations and/or combination with handlers/probers can be configured with one test system, thereby providing highest value of ownership. Each test station and/or handler/prober can run different independent test programmes, simultaneously testing different devices. The test system is device package independent, applicable test sockets need to be ordered for the manual test station and/or appropriate handler used for the required surface mount or conventional leaded package outlines.
(to be expanded with optional configurations).
Test System with two Manual Test Stations Click on the image to enlarge
Test System with One Head Box for interface with Auto Handler (customer provided) & One Manual Test Station Click on the image to enlarge
Test System with Two Head Boxes for interface with Auto Handlers (customer provided)
Click on the image to enlarge
To review the multiple configuration possibilities, please visit the section on Applications
Testing PrincipleS
The OnTest Model T-201 is an Automatic Discrete Semiconductor Tester which employs 16 bit Analog-Digital Converter and utilizes the forcing V/I supplies with four digit measurement. Performs DC, AC, and pulsed tests.
Power supply capable to measure breakdown voltages to a potential up to 1,000 V (standard, optional upto 2,500 V) and high current tests up to 20 A (standard, optional upto 100 A). During high current testing, device heating is kept to a minimum by use of low duty cycle pulse.
As standard, each test can be conducted with upto two (2) bias/forcing conditions, both voltage and current compliance, using 12 bit digital – analog converter. System option can be made available for a third bias for special tests with an additional 12 bit digital – analog converter. Sensing is done using precision op amps and 16 bit analog-digital converter. Low current measurement accuracy is ensured by conducting the measurement near the device under test (DUT).
Measurement speed and accuracy are further enhanced by use of a common mother board while each analog – digital card has independent microcontrollers for switching of the reed relays using the dry switching technique, ensuring longer life for the reeds.
Interface Card for Manual Station or Handler / Wafer Prober
The interface card provides interface capability with all standard handler or wafer prober makes and models or with manual test stations, using programmable hardware switches. This interface provides logic interface, active low or active high for signals – Start Of Test (T start), End of Test (T end). The 14 logical bins are individually programmable and can be either Latch or Pulse Type.
Head Box
Head Box for interface with any standard handler or prober
• Digital card with handler bin, T start, T end, I/F and I-V, LV Sensing
• Analog Card
Test time
• Auto Test Time
Current and Voltage dependent
• Manual Test Time
400 μS to 9 Sec (programmable)
Test Results
Four digit measurement.
High throughput production mode: Analog values are converted to digital values by an A/D converter, compared with program limits for Go/No Go decision.
Manual test mode: Characterization, Quality Control or R&D – true value measurement in analog “true” values.
